Provides Higher Sensitivity and Reduces Operational Costs
Provides Higher Sensitivity and Reduces Operational Costs
A large-capacity differential exhaust turbomolecular pump and a high-performance flow controller ensure that the utmost in sensitivity is obtained under all conditions used for GC. This sensitivity combined with high-speed analysis capabilities helps maximize laboratory efficiency by reducing analysis times. In addition, the system can be safely operated using carrier gases other than helium, such as hydrogen or nitrogen, thereby reducing operating costs.
Technology Achieves High Sensitivity
Ion Source Featuring High Sensitivity and Long-Term Stability
The filament and the ion source box have been separated, which reduces the impact of the filament potential on the interior of the ion source. In addition, a shield is provided to block radiant heat generated by the filament, achieving a uniform temperature inside the ion source box. Thus, active spots inside the ion source are not prone to occur, enabling high-sensitivity analysis with long-term stability. (Patent: US7939810)
New Flow Controller Achieves Exceptional Reproducibility
A new flow controller (AFC) with a CPU uses various control methods to control carrier gas flow to a constant flow speed, flowrate, or pressure. It can also accurately trace the analytical conditions already being used. The split line filter can be replaced without any tools. Internal contamination can be confirmed visually, ensuring filters are replaced at the proper time.
Large-Capacity Differential Exhaust System
Through adoption of a new type of turbomolecular pump with increased exhaust efficiency, the system's performance is greatly improved when using hydrogen or nitrogen, in addition to helium, as the carrier gas. Moreover, a differential exhaust method is used to create a vacuum separately for the ion source and the quadrupole. As a result, an optimal MS state can be realized regardless of the conditions imposed by the carrier gas used.
One Touch Inlet Maintenance
The injection port can be opened or closed without tools by simply sliding the ClickTek™ lever. Replace the insert, slide the lever and feel the click for a leak-free install every time.
High-Speed Scan Control Technology
Advanced Scanning Speed Protocol (ASSP™)
The rod bias voltage is automatically optimized during high-speed data acquisition, which minimizes sensitivity deterioration during high-speed scans of 10,000 u/sec or faster. The sensitivity obtained is at least five times better than with conventional systems. This is effective for scan data sensitivity improvements and favorable mass spectrum acquisition, particularly in high-speed analysis with Fast-GC/MS, simultaneous Scan/SIM, FASST analysis, and applications using GC × GC-MS. (Patent: US6610979)
Advanced GC Oven
The improved temperature control function enables more precise temperature control of the GC oven, which improves the precision of retention time reproducibility. In addition, three oven cooling rate levels can be specified to minimize damage to column liquid phases and maximize the service life.
Reduced Operating Costs Using Alternative Carrier Gases
Hydrogen and nitrogen are less expensive than helium and are readily available, so they are attracting attention as alternative carrier gases. The high-performance Advanced Flow Controller (AFC) provides accurate control even with hydrogen and nitrogen. In addition, the new large-capacity differential exhaust system enhances the vacuum performance when hydrogen or nitrogen is used as the carrier gas, so the optimal MS state is achieved under all carrier gas conditions.
Application Example Using Hydrogen as the Carrier Gas
Hydrogen and nitrogen provide less sensitivity than helium. However, chromatogram patterns equivalent to when helium is used can be obtained by using a short column with a narrow internal diameter. EZGC® Method Translator*1, a method conversion program provided by Restek, can convert the analysis conditions when helium is used to the optimal analysis conditions for the alternative carrier gas.
*1 EZGC is a trademark of Restek Corporation. For details, refer to the Restek Corporation website. http://www.restek.com/ezgc-mtfc
The retention indices are essentially unchanged even when the conventionally used analysis conditions are converted for using hydrogen as the carrier gas. Mass spectral libraries containing retention indices and databases provided by Shimadzu should be used.
Hydrogen Sensor Assures Safety
Hydrogen Sensor Monitors
Inside of GC Oven
A hydrogen sensor (optional) can be installed inside the GC. By discovering potential leaks in advance, accidents can be prevented. Furthermore, the main unit is equipped with an automatic carrier gas leak checking function, which strongly supports the use of hydrogen as a carrier gas.